Semiconductor integrated circuit device

ABSTRACT

A semiconductor integrated circuit device is provided which comprises a semiconductor chip having wire bonding pads and a package encapsulating the semiconductor chip and connected via bonding wires to the wire bonding pads, wherein wire bonding pads on the semiconductor chip are arranged in two rows in a staggered manner along a periphery of the semiconductor chip, and of the wire bonding pads, power supply pads are arranged in a rear row located close to a semiconductor integrated circuit unit as an active area on the semiconductor chip and in a front row, only signal pads are arranged. Because the power supply pads are provided in the rear row, the line width of a power supply line led out from each power supply pad can be made equal to the width of the pad, thus reducing the impedance of the connection circuit between the semiconductor chip and the package, and suppressing generation of radiation noise, ground bounce and so on.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The present invention relates to a semiconductor integrated circuitdevice (IC package) having a semiconductor chip encapsulated with apackage comprised of a resin and being capable of suppressing radiationnoise or ground bounce noise caused by a connection wiring structurebetween the semiconductor chip and the package.

2. Related Background Art

In recent years, with the progress of semiconductor fine processingtechnology involving further enlargement of circuit scale, the adverseaffect of radiation noise or ground bounce noise generated from asemiconductor integrated circuit device (IC) on other electronic devicesand malfunction of a circuit itself has become a large problem.

The radiation noise or ground bounce noise is caused by the fact thatwhen an internal circuit of an IC operates, a large current flowsthrough a path of a power terminal of a bypass capacitor→a power line ofa printed wiring board→a power line of a package→a power line of asemiconductor chip→an internal load (semiconductor integrated circuitunit)→a ground line of the semiconductor chip→a ground line of thepackage→a ground line of the printed wiring board→a ground terminal ofthe bypass capacitor. Specifically, due to an inductance component ofthe path, a potential variation occurs which is expressed by anequation: ΔV=−L·di/dt, where ΔV is an amount of the potential variation,L is an inductance value, and di/dt is an amount of current variationper unit time. This potential variation directly works as ground bounceto thereby cause malfunction of the circuit, or propagates directly to amain power wiring on the printed wring board or to a signal input/outputline (signal line) of the IC to be radiated as radiation noise.

Accordingly, in order to suppress the radiation noise, making theimpedance of the current path extending from the bypass capacitor to thesemiconductor chip as small as possible is a very important subject.With regard to this subject, Japanese Patent Application Laid-Open Nos.H05-160333 and H09-22977 disclose that power supply lines (ground lineand power line) of a package connected to a plurality of electrode padsfor wire bonding (wire bonding pads) are made common to each other andled out with a large width.

Further, with the progress of semiconductor fine processing technologyinvolving further enlargement of circuit scale, the size of an outerperipheral region of a semiconductor chip having wire bonding padsdisposed therein becomes smaller, and at the same time the number ofelectrode pads becomes larger. Consequently, there has been adopted astructure in which wire bonding pads are arranged in two rows in astaggered (or zigzag) manner, instead of the arrangement in a single rowadopted in the prior art. Japanese Patent Application Laid-Open No.H11-87399 discloses that in this staggered arrangement, for the purposeof stabilizing the characteristic impedance of a signal line andsecuring power supply to the circuit, a signal pad and a power supplypad (power pad and ground pad) are disposed as one set.

FIG. 7 shows a conventional example, and is a plan view showing theinside of an IC. Wire bonding pads 112 on a semiconductor chip 111 aredisposed in two rows in a staggered manner. Of the wire bonding pads112, wire bonding pads 112 a are assigned to a front row that is locatedless inside of the semiconductor chip 111, and wire bonding pads 112 bare assigned to a rear row that is located more inside of thesemiconductor chip 111. Lines 113 a from the wire bonding pads 112 a ofthe front row, and lines 113 b from the wire bonding pads 112 b of therear row are connected to a semiconductor integrated circuit unit (notshown) disposed inside the semiconductor chip 111. In this case, thelines 113 a are disposed so as to pass between the wire bonding pads 112b of the rear row. The wire bonding pads 112 a and 112 b are used assignal pads or power supply pads.

Similarly, wire bonding pads 116 on a package 115 connected via bondingwires 114 to the semiconductor chip 111 are also disposed in two rows ina staggered manner. Of the wire bonding pads 116, wire bonding pads 116a are assigned to a rear row that is located more inside of the package115, and wire bonding pads 116 b are assigned to a front row that islocated less inside of the package 115. Lines 117 a from the wirebonding pads 116 a of the rear row, and lines 117 b from the wirebonding pads 116 b of the front row are connected to lead pins or BGAball lands (not shown) used to connect to the outside of the package115. In this case, the lines 117 b are disposed so as to pass betweenthe wire bonding pads 116 a in the rear row. The wire bonding pads 116 aand 116 b are used as signal pads or power supply pads.

However, in such an IC as shown in FIG. 7, when wire bonding pads 112 aassigned to the front row located outside of the rear row are used aspower supply pads, a power supply line 113 a must pass between twosignal pads 112 b. Thus, the line width of the power supply line of thepackage cannot exceed the distance between two power supply pads 112 b.Similarly, when wire bonding pads 116 b assigned to the front rowlocated outside of the rear row of the package 115 are used as powersupply pads, the line width of the power supply line 117 b cannot exceedthe distance between two power supply pads 116 a. Accordingly, theimpedance of the power supply lines 113 a and 117 b cannot be lowered,thus restricting the reduction of impedance of the current path of theentire IC. Consequently, there has been posed a problem that muchradiation noise and ground bounce noise will be generated.

SUMMARY OF THE INVENTION

It is, therefore, an object of the present invention to provide asemiconductor integrated circuit device comprising therein a highlyintegrated semiconductor chip and having wire bonding pads arranged inat least two rows in a staggered manner, which semiconductor integratedcircuit device can significantly contribute to reduction of impedancefor an entire power supply path, and to reduction in size of a package.

In order to achieve the above object, the present invention provides asemiconductor integrated circuit device comprising:

a semiconductor chip having wire bonding pads arranged at a periphery ofa semiconductor integrated circuit unit; and

a package encapsulating the semiconductor chip and having linesconnected via bonding wires to the wire bonding pads,

wherein the wire bonding pads comprise signal pads and power supplypads, and are arranged in a plurality of rows along the periphery of thesemiconductor chip, and power supply pads of the wire bonding pads forsupplying power to the semiconductor integrated circuit unit aredisposed in an innermost of the plurality of rows.

Further, the present invention provides a semiconductor integratedcircuit device characterized in that a power supply line led out from apower supply pad provided on the semiconductor chip has a width (orthickness) not less than a width (or thickness) of the power supply pad.

Moreover, the present invention provides a semiconductor integratedcircuit device characterized in that the package has second wire bondingpads arranged therein which are connected via the bonding wires to thefirst wire bonding pads, wherein the second wire bonding pads comprisesignal pads and power supply pads, and are arranged in a plurality ofrows along a periphery of the package, and those power supply pads ofthe second wire bonding pads for supplying power to the semiconductorchip are disposed in the innermost row of the plurality of rows.

Further, the present invention provides a semiconductor integratedcircuit device characterized in that the package is a BGA package havinga plurality of rows of ball lands, the plurality of rows of ball landscomprise power supply lands connected via power supply lines to thepower supply pads and signal lands connected via signal lines to thesignal pads, and the power supply lands are disposed in one of theplurality rows that is located closest to the power supply pads.

The above and other objects of the present invention will become moreapparent from the following description taken in conjunction with theaccompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1A and 1B are plan views showing the inside of an IC according toExample 1 of the invention;

FIG. 2 is a plan view showing the inside of an IC according to Example 2of the invention;

FIG. 3 is a plan view showing the inside of an IC according to Example 3of the invention;

FIG. 4 is a plan view showing the inside of an IC according to Example 4of the invention;

FIG. 5 is a plan view showing the inside of an IC according to Example 5of the invention;

FIG. 6 is a plan view showing the inside of an IC according to Example 6of the invention; and

FIG. 7 is a plan view showing the inside of an IC according to the priorart.

DESCRIPTION OF THE PREFERRED EMBODIMENTS

Preferred embodiments of the invention will now be described withreference to the drawings.

EXAMPLE 1

FIG. 1A is a plan view showing the inside of an IC according to Example1 of the invention. Wire bonding pads 12 on a semiconductor chip 11 aredisposed in two rows in a staggered manner. Of the wire bonding pads 12,power supply pads 12 a (power pad and ground pad) are all assigned tothe wire bonding pads in a rear row that is located more inside of thesemiconductor chip 11. On the other hand, of the wire bonding pads 12,signal pads 12 b may be assigned to any of the wire bonding pads. Powersupply lines 13 a from the power supply pads 12 a, and signal lines 13 bfrom the signal pads 12 b are connected to a semiconductor integratedcircuit unit (not shown) disposed inside the semiconductor chip 11. Inthis case, the line width of the power supply lines 13 a thus disposedis equal to or larger than the width of the power supply pads 12 a. Thepower supply lines 13 a from the power supply pads 12 a disposed at therear row that is located more inside of the semiconductor chip 11 arenot restricted by the other of the wire bonding pads 12 and cantherefore have such a large line width.

Wire bonding pads 16 on package 15 connected via bonding lines 14 to thesemiconductor chip 11 are also disposed in two rows in a staggeredmanner. Similarly to the case of the semiconductor chip 11, of the wirebonding pads 16, power supply pads 16 a (power pad and ground pad) areall assigned to the wire bonding pads in a rear row that is located moreinside of the package 15. On the other hand, of the wire bonding pads16, signal pads 16 b may be assigned to any of the wire bonding pads.Power supply lines 17 a from the power supply pads 16 a, and signallines 17 b from the signal pads 16 b are connected to lead pins or BGAball lands (not shown) used to connect to the outside of the package 15.In this case, the line width of the power supply lines 17 a thusdisposed is equal to or larger than the width of the power supply pads16 a. The power supply lines 17 a from the power supply pads 16 adisposed at the rear row that is located more inside of the package 15are not restricted by the other of the wire bonding pads 16 and cantherefore have such a large line width.

In this way, the impedance of the power supply lines 13 a and 17 a canbe reduced, thereby lowering the impedance of a current path for theentire IC. Specifically, by making as large as possible the width of apower supply line extending from a bypass capacitor installed on aprinted wiring board having a package of a semiconductor integratedcircuit device mounted thereon to a semiconductor integrated circuitunit (active area) in a semiconductor integrated circuit device andeffecting electrical connection thereof, it is possible to make theelectrical connection impedance of the power supply line as small aspossible, thus reducing the potential variation caused by a currentcomponent flowing through the power supply line to thereby preventeffectively troubles associated with radiation noise or ground bounce.

In the example shown in FIG. 1A, the wire bonding pads 12 are arrangedin two rows in a staggered manner both in the semiconductor chip 11 andthe package 15. According to the present invention, the wire bondingpads 12 do not always have to be disposed in two rows in a staggeredmanner both in the semiconductor chip 11 and the package 15, but may bedisposed only in either one thereof. FIG. 1B is a plan view showing theinside of an IC in which wire bonding pads are disposed in two rows in astaggered manner only in the semiconductor chip 11.

Referring to FIG. 1B, the semiconductor chip 11 is similar in structureto the one shown in FIG. 1A. Thus the same reference numerals areapplied to parts corresponding to those in FIG. 1A, and an explanationthereof is omitted. On package 25, there are assigned power supply lines27 a and signal lines 27 b, both of which are formed by extending leadpins. Further, the power supply lines 27 a and signal lines 27 b alsoserve as wire bonding pads of the package 25, and are connected viabonding wires 24 to wire bonding pads 12 a and 12 b on the semiconductorchip 11. In this case, the line width of the power supply lines 27 a canbe made as large as possible to effectively lower the impedance of thecurrent path for the entire IC.

EXAMPLE 2

FIG. 2 is a plan view showing the inside of an IC according to Example 2of the invention. FIG. 2 shows a case where the package is a BGA (BallGrid Array). Referring to FIG. 2, the semiconductor chip 11 has astructure similar to the one shown in FIG. 1A. Thus, the same referencenumerals are applied to parts corresponding to those in FIG. 1A, and anexplanation thereof is omitted.

In FIG. 2, similarly to Example 1 shown in FIG. 1A, wire bonding pads 36on package 35 are disposed in two rows in a staggered manner. Of thewire bonding pads 36, power supply pads 36 a are all disposed in a rearrow that is located more inside of the package 35, and in a front rowthat is located less inside of the package 35, there are deposed onlysignal pads 36 b. Wire bonding pads 12 on the semiconductor chip 11 areconnected via bonding wires 34 to the wire bonding pads 36 on thepackage 35. With this arrangement, power supply lines 37 a each have alarge line width led out from the wire bonding pads 36 do not passbetween signal lands 38 b, and therefore the line width of the powersupply lines 37 a can be increased so as to be equal to the width of thepower supply pads 36 a.

Further, of the BGA ball lands 38, the power supply lands 38 a, whichare power lands or ground lands, are disposed in a row located closestto the wire bonding pads 36. Accordingly, the power supply lines 37 ahaving a large line width led out from the wire bonding pads 36 can beconnected to the power supply lands 38 a with the smallest length.

Indicated by dashed lines in FIG. 2 are a power line 39 a, a ground line39 b, and a bypass capacitor 39 c mounted therebetween. The power line39 a is electrically connected via a ball to a power supply land 38 a(power land), and the ground line 39 b is electrically connected via aball to a power supply land 38 a (ground land). With this configuration,it is possible to make as low as possible the impedance of the entirecurrent path extending from the bypass capacitor to the semiconductorintegrated circuit mounted on the printed wiring board.

With the configuration shown in Example 2, even when the package is aBGA, the lowering in impedance of the current path for the entire IC canbe achieved.

EXAMPLE 3

FIG. 3 is a plan view showing the inside of an IC according to Example 3of the invention, in which the package is a BGA. Referring to FIG. 3,the semiconductor chip 11 has a structure similar to the one shown inFIG. 1A. Thus, the same reference numerals are applied to partscorresponding to those in FIG. 1A, and an explanation thereof isomitted.

As shown in FIG. 3, the total number of BGA ball lands 48 provided in apackage 45, including power supply lands 48 a and signal lands 48 b usedto connect to the printed wiring board, is larger than the total numberof wire bonding pads 46 used as power supply pad or signal pad. Wirebonding pads 12 on the semiconductor chip 11 are connected via bondinglines 44 to the wire bonding pads 46 on the package 45. A plurality ofpower supply lands 48 a are connected in series to a single power supplyline 47 a having a large line width led out from the wire bonding pad46. Accordingly, the impedance of the electrical connection between thepackage 45 and the printed wiring board can be lowered.

EXAMPLE 4

FIG. 4 is a plan view showing the inside of an IC according to Example 4of the invention. Referring to FIG. 2, in Example 2, both the powersupply land 38 a and signal land 38 b are disposed outside thesemiconductor chip 11. On the contrary, in Example 4, there is shown acase where power supply lands 38 a are disposed inside the semiconductorchip 11. In FIG. 4, the same reference numerals are applied to memberscorresponding to those in FIG. 2, and an explanation thereof is omitted.

In FIG. 4, similarly to FIG. 2, wire bonding pads 66 on package 65 aredisposed in two rows in a staggered manner. Of the wire bonding pads 66,all power supply pads 66 a are disposed in a front row that is locatedless inside of a package 65. In a rear row that is located more insideof the package 65, there are disposed only signal pads 66 b. Wirebonding pads 12 on the semiconductor chip 11 and the wire bonding pads66 on the package 65 are connected to each other via bonding wires 64.In this case, of BGA ball lands 68, power supply lands 68 a as powerlands or ground lands are disposed under the semiconductor chip 11, asillustrated by dotted lines. Signal lands 68 b are disposed outside thesemiconductor chip 11. Thus, power supply lines 67 a having a large linewidth from the power supply pads 66 a extend toward the inside of thesemiconductor chip 11 and connected to the power supply lands 68 a.Further, signal lines 67 b having a small line width from the signalpads 66 b extend toward the outside of the semiconductor chip 11 andconnected to the signal lands 68 b. Incidentally, power lines 69 aextend from the power supply lands 68 a; ground lines 69 b extend fromthe signal lands 68 b; and between the power lines 69 a and the signallands 68 b, there is mounted a bypass capacitor 69 c.

With this arrangement, the power supply lines 67 a each having a largeline width led out from the wire bonding pads 66 do not pass between thesignal lands 68 b, and therefore the line width of the power supplylines 67 a can be increased so as to be equal to the width of the powersupply pads 66 a. Accordingly, the lowering in impedance of the currentpath for the entire IC can be achieved. Incidentally, referring to FIG.4, although all the power supply lands 68 a are disposed under thesemiconductor chip 11, the present invention is not limited thereto.According to the example, all the power supply pads 66 a connected tothe power supply lands 68 a arranged under the semiconductor chip 11 aredisposed in the front row that is located less inside of the package 65,while all the signal pads 66 b connected to the signal lands 68 barranged outside the semiconductor chip 11 are disposed in the rear rowthat is located more inside of the package.

EXAMPLE 5

FIG. 5 is a plan view showing the inside of an IC according to Example 5of the invention, in which the package is a BGA. Wire bonding pads 52 onsemiconductor chip 51 are disposed in two rows in a staggered manner. Ofthe wire bonding pads 52, power supply pads 52 a are all assigned to thewire bonding pads in a rear row that is located more inside of thesemiconductor chip 51. Further, of the wire bonding pads 52, signal pads52 b can be assigned to any of the wire bonding pads. An NC pad 52 c isassigned to a front row that is located less inside of the semiconductorchip 51 between two adjacent power supply pads 52 a.

Power supply lines 53 a from the power supply pads 52 a, and signallines 53 b from the signal pads 52 b are connected to a semiconductorintegrated circuit unit (not shown) disposed inside the semiconductorchip 51. In this case, the power supply lines 53 a thus disposed have aline width equal to or larger than the width of the power supply pads 52a. No line from the NC pad 52 c is provided.

Similarly, wire bonding pads 56 on a package 55, which are connected viabonding lines 54 to the semiconductor chip 51, are also disposed in tworows in a staggered manner. Of the wire bonding pads 56, power supplypads 56 a are all assigned to the wire bonding pads in a rear row thatis located more inside of the package 55. Further, of the wire bondingpads 56, signal pads 56 b can be assigned to any of the wire bondingpads. Moreover, an NC pad 56 c is assigned to a front row that islocated less inside than the rear row of the package of the package 55between two adjacent power supply pads 56 a.

Power supply lines 57 a from the power supply pads 56 a are connected topower supply lands 58 a. Further, signal lines 57 b from the signal pads56 b are connected to signal lands 58 b. In this case, the power supplylines 57 a thus disposed have a line width equal to or larger than thewidth of the power supply pads 56 a. No line from the NC pad 56 c isprovided.

With this configuration, any signal line 53 b is not disposed betweentwo power supply lines 53 a on the semiconductor chip 51, and thereforethe coupling between the two power supply lines 53 a is increased, thusenabling low impedance wiring and connection. Similarly, any signal line57 b is not disposed between two power supply lines 57 a on the package55, and therefore the coupling between the two power supply lines 57 ais increased, thus enabling further low impedance wiring and connection.

EXAMPLE 6

FIG. 6 is a plan view showing the inside of an IC according to Example 6of the invention, in which the package is a BGA. Wire bonding pads 72 ona semiconductor chip 71 are disposed in two rows in a staggered manner.Of the wire bonding pads 72, power supply pads 72 a are all assigned tothe wire bonding pads in a rear row that is located more inside of thesemiconductor chip 71. Also, of the wire bonding pads 72, signal pads 72b may be assigned to any of the wire bonding pads.

Power supply lines 73 a from the power supply pads 72 a, and signallines 73 b from the signal pads 72 b are connected to a semiconductorintegrated circuit unit (not shown) disposed inside the semiconductorchip 71. In this case, the power supply lines 73 a thus disposed eachhave a line width equal to or larger than the width of the power supplypad 72 a.

Similarly, wire bonding pads 76 on a package 75 are disposed in two rowsin a staggered manner. Of the wire bonding pads 76, power supply pads 76a are all assigned to the wire bonding pads in a rear row that islocated more inside of the package 55. Further, of the wire bonding pads76, signal pads 76 b may be assigned to any of the wire bonding pads.

Power supply lines 77 a from the power supply pads 76 a are connected topower supply lands 78 a. Further, signal lines 77 b from the signal pads76 b are connected to signal lands 78 b. In this case, the power supplylines 77 a thus disposed each have a line width equal to or larger thanthe width of the power supply pads 76 a.

The connection between the power supply pads 72 a on the semiconductorchip 71 and the power supply pads 76 a on the package 75, and theconnection between the signal pads 72 b on the semiconductor chip 71 andthe signal pads 76 b on the package 75 are performed with bonding lines74. Also, the power supply lines 73 a on the semiconductor chip 71 andthe power supply pads 76 a on the package 75 are connected via bondinglines 74 a. This configuration is attained by making large the linewidth of the power supply lines 73. Similarly, the power lines 77 a onthe package 75 and the power supply pads 72 a on the semiconductor chip71 may be connected via the bonding lines 74 a.

With this configuration, the impedance of the connection between thepower supply lines 73 a on the semiconductor chip 71 and the powersupply lines 77 a on the package 75 can further be lowered.

The invention can be applied widely to a driving IC for driving aLiquid-jet head mounted on a laser printer or the like, or to a drivingunit of various kinds of optical devices.

Of wire bonding pads disposed in at least two rows in a staggered manneron a semiconductor chip, power pads and ground pads for power supply(power supply pads) are disposed in a rear row that is located moreinside of the semiconductor chip, so that power lines and ground lineson the semiconductor chip led out from wire bonding pads do not passbetween wire bonding pads disposed in a front row that is located lessinside than the rear row of the semiconductor chip. Accordingly,electrical connection to a semiconductor integrated circuit unitdisposed inside the semiconductor chip can be performed by use of widelines. This makes it possible to reduce the impedance of the powersupply path extending from the wire bonding pads on the semiconductorchip to the semiconductor integrated circuit unit.

Further, of wire bonding pads disposed in at least two rows in astaggered manner on a package, power pads and ground pads are disposedin a rear row that is located more inside of the semiconductor packageand distant from the wire bonding connecting end. In this state, powerlines and ground lines led out from wire bonding pads do not passbetween wire bonding pads disposed in a front row that is located lessinside than the rear row, so that electrical connection to lead pins orBGA ball lands being in contact with a printed wiring board can beperformed by use of wide lines. This makes it possible to reduce theimpedance of the power supply path extending from the wire bonding padson the package to lines of the semiconductor chip.

Incidentally, ICs of a lead type such as SOP, QFP or the like includeones in which a package has no line disposed thereon and lines arebonded directly to lead pins. In this case, the above-describedlow-impedance connection can be applied to lines on a semiconductorchip.

This application claims priorities from Japanese Patent Application Nos.2004-047408 filed on Feb. 24, 2004 and 2005-033018 filed on Feb. 9,2005, which are hereby incorporated by reference herein.

1. A semiconductor integrated circuit device comprising: a semiconductorchip having first wire bonding pads arranged at a periphery of asemiconductor integrated circuit unit; and a package encapsulating thesemiconductor chip and having second wire bonding pads connected viabonding wires to the first wire bonding pads, wherein the first wirebonding pads comprise signal pads and power supply pads, and arearranged in a plurality of rows along a periphery of the semiconductorchip, and power supply pads of the first wire bonding pads for supplyingpower to the semiconductor integrated circuit unit are disposed in theinnermost of the plurality of rows, and wherein the second wire bondingpads comprise signal pads and power supply pads, and are arranged in aplurality of rows along a periphery of the package, and power supplypads of the second wire bonding pads for supplying power to thesemiconductor chip are disposed in the innermost of the plurality ofrows, wherein each of the first and second wire bonding pads arearranged in the plurality of rows in a staggered manner, and wherein thepower supply pads on the semiconductor chip are disposed adjacent toeach other, and an outer edge of an NC pad not connected to any line isdisposed outwardly with respect to an outer edge of the power supplypads of the semiconductor chip between two adjacent power supply pads.2. A semiconductor integrated circuit device comprising: a semiconductorchip having first wire bonding pads arranged at a periphery of asemiconductor integrated circuit unit; and a package encapsulating thesemiconductor chip and having second wire bonding pads connected viabonding wires to the first wire bonding pads, wherein the first wirebonding pads comprise signal pads and power supply pads, and arearranged in a plurality of rows along a periphery of the semiconductorchip, and power supply pads of the first wire bonding pads for supplyingpower to the semiconductor integrated circuit unit are disposed in theinnermost of the plurality of rows, and wherein the second wire bondingpads comprise signal pads and power supply pads, and are arranged in aplurality of rows along a periphery of the package, and power supplypads of the second wire bonding pads for supplying power to thesemiconductor chip are disposed in the innermost of the plurality ofrows, wherein each of the first and second wire bonding pads arearranged in the plurality of rows in a staggered manner, and wherein thepower supply pads on the package are disposed adjacent to each other,and an outer edge of an NC pad not connected to any line is disposedoutwardly with respect to an outer edge the power supply pads of thepackage between two adjacent power supply pads.